מלטש חתך רוחב

JEOL IB-19530CP

Easy-to-use preparation system for producing high-quality sample cross-sections for SEM, EPMA, and Auger applications.

Features:
• Artifact-free cross-section polishing with argon ions, ideal for subsequent SEM imaging or EBSD analysis
• Preparation of soft materials, composites up to hard metals/diamond
• (Re-)polishing of embedded sections
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• Carbon or metal coating / sputtering possible
• Monitoring of preparation progress via integrated camera
• Dimensions: 587 mm W x 802 mm D x 429 mm H

המודעה תורגמה אוטומטית. ייתכנו שגיאות בתרגום.